New Insights Into Defect Loss, Slowdown, and Device Lifetime Enhancement (2013)

First Author: Meng Duan
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2223702

Publication URI: http://dx.doi.org/10.1109/ted.2012.2223702

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 1