Energy Distribution of Positive Charges in Gate Dielectric: Probing Technique and Impacts of Different Defects (2013)

First Author: Hatta S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2013.2255129

Publication URI: http://dx.doi.org/10.1109/ted.2013.2255129

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 5