Energy Distribution of Positive Charges in Gate Dielectric: Probing Technique and Impacts of Different Defects (2013)
Attributed to:
High permittivity dielectrics on Ge for end of Roadmap application
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2013.2255129
Publication URI: http://dx.doi.org/10.1109/ted.2013.2255129
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 5