Evaluation and Solutions for P/E Window Instability Induced by Electron Trapping in High-<inline-formula> <tex-math notation="TeX">$\kappa$ </tex-math></inline-formula> Intergate Dielectrics of Flash Memory Cells (2014)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2014.2313041
Publication URI: http://dx.doi.org/10.1109/ted.2014.2313041
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 5