Thermal Conductivity Measurement Methods for SiGe Thermoelectric Materials (2013)

First Author: Llin L
Attributed to:  Scanning thermal conduction microscopy with dual cantilever resistive probe funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s11664-013-2505-3

Publication URI: http://dx.doi.org/10.1007/s11664-013-2505-3

Type: Journal Article/Review

Parent Publication: Journal of Electronic Materials

Issue: 7