Determination of the deposition order of overlapping latent fingerprints and inks using secondary ion mass spectrometry. (2012)

First Author: Bright NJ
Attributed to:  Ambient Pressure Mass Spectrometry at the Sub Micron Scale funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/ac300185j

PubMed Identifier: 22462501

Publication URI: http://europepmc.org/abstract/MED/22462501

Type: Journal Article/Review

Volume: 84

Parent Publication: Analytical chemistry

Issue: 9

ISSN: 0003-2700