High accuracy traceable Rutherford backscattering spectrometry of ion implanted samples (2014)

First Author: Colaux J

Attributed to: University of Surrey Ion Beam Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c3ay41398e

Publication URI: http://dx.doi.org/10.1039/c3ay41398e

Type: Journal Article/Review

Parent Publication: Anal. Methods

Issue: 1