Measurement of the physical and electronic properties of ordered nanoporous alumina using XUV excitation spectroscopy (2009)
Attributed to:
Semiconductor Research at the Materials-Device Interface
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/42/19/195404
Publication URI: http://dx.doi.org/10.1088/0022-3727/42/19/195404
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 19
ISSN: 0022-3727