Precision plasma etching of Si, Ge, and Ge:P by SF6 with added O2 (2014)
Attributed to:
Creating Silicon Based Platforms for New Technologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1116/1.4868615
Publication URI: http://dx.doi.org/10.1116/1.4868615
Type: Journal Article/Review
Parent Publication: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Issue: 3