Electrical Isolation of Dislocations in Ge Layers on Si(001) Substrates through CMOS Compatible Suspended Structures (2013)
Attributed to:
Creating Silicon Based Platforms for New Technologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1149/05009.0737ecst
Publication URI: http://dx.doi.org/10.1149/05009.0737ecst
Type: Journal Article/Review
Parent Publication: ECS Transactions
Issue: 9