Electrical Isolation of Dislocations in Ge Layers on Si(001) Substrates through CMOS Compatible Suspended Structures (2013)

First Author: Shah V

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1149/05009.0737ecst

Publication URI: http://dx.doi.org/10.1149/05009.0737ecst

Type: Journal Article/Review

Parent Publication: ECS Transactions

Issue: 9