Study of statistical variability in nanoscale transistors introduced by LER, RDF and MGG (2013)
Attributed to:
Multiscale Modelling of Metal-Semiconductor Contacts for the Next Generation of Nanoscale Transistors
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/cde.2013.6481351
Publication URI: http://dx.doi.org/10.1109/cde.2013.6481351
Type: Conference/Paper/Proceeding/Abstract
ISBN: 978-1-4673-4666-5