Scanning Probe Microscopy Imaging before and after Atomic Layer Oxide Deposition on a Compound Semiconductor Surface (2012)

First Author: Melitz W
Attributed to:  III-V MOSFETs for Ultimate CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/ssp.187.9

Publication URI: http://dx.doi.org/10.4028/www.scientific.net/ssp.187.9

Type: Journal Article/Review

Parent Publication: Solid State Phenomena