Scanning Probe Microscopy Imaging before and after Atomic Layer Oxide Deposition on a Compound Semiconductor Surface (2012)
Attributed to:
III-V MOSFETs for Ultimate CMOS
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/ssp.187.9
Publication URI: http://dx.doi.org/10.4028/www.scientific.net/ssp.187.9
Type: Journal Article/Review
Parent Publication: Solid State Phenomena