A TEM Nanoanalytic Investigation of Pd/Ge Ohmic Contacts for the Miniaturization and Optimization of InGaAs nMOSFET Devices. (2009)
Attributed to:
III-V MOSFETs for Ultimate CMOS
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927609094483
Publication URI: http://dx.doi.org/10.1017/s1431927609094483
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S2