The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers (2009)

First Author: Swaraj S
Attributed to:  Structural Nanoprobes of Organic Semiconductor Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1140/epjst/e2009-00946-3

Publication URI: http://dx.doi.org/10.1140/epjst/e2009-00946-3

Type: Journal Article/Review

Parent Publication: The European Physical Journal Special Topics

Issue: 1