Direct decay measurement of capacitance in a bismuth ferrite electroceramic (2012)
Attributed to:
SEM-based Technique for Local Property Measurements in Electroceramic Thick/Thin Films: Proof of Principle
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/s10854-012-0877-4
Publication URI: http://dx.doi.org/10.1007/s10854-012-0877-4
Type: Journal Article/Review
Parent Publication: Journal of Materials Science: Materials in Electronics
Issue: 2