Defects at Ge:GeO2 and Ge:MeOx interfaces (2013)

First Author: Li H
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2013.03.111

Publication URI: http://dx.doi.org/10.1016/j.mee.2013.03.111

Type: Journal Article/Review

Parent Publication: Microelectronic Engineering