Impact of Hot Carrier Aging on Random Telegraph Noise and Within a Device Fluctuation (2016)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/jeds.2015.2502760
Publication URI: http://dx.doi.org/10.1109/jeds.2015.2502760
Type: Journal Article/Review
Parent Publication: IEEE Journal of the Electron Devices Society
Issue: 1