Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems (2015)
Attributed to:
Equipment in support of Investigations in Gravitational Radiation
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physrevd.92.062001
Publication URI: http://dx.doi.org/10.1103/physrevd.92.062001
Type: Journal Article/Review
Parent Publication: Physical Review D
Issue: 6
ISSN: 1550-7998