Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems (2015)

First Author: Murray P

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevd.92.062001

Publication URI: http://dx.doi.org/10.1103/physrevd.92.062001

Type: Journal Article/Review

Parent Publication: Physical Review D

Issue: 6

ISSN: 1550-7998