📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Electronic noise in charge sensitive preamplifiers for X-ray spectroscopy and the benefits of a SiC input JFET (2015)

First Author: Lioliou G
Attributed to:  High Efficiency Betavoltaic Cells funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nima.2015.08.042

Publication URI: http://dx.doi.org/10.1016/j.nima.2015.08.042

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment