Multi-subband interface roughness scattering using 3D Finite Element Monte Carlo with 2D Schödinger equation for simulations of sub-16nm FinFETs (2015)

First Author: Nagy D
Attributed to:  Modelling of Carrier Transport in Ultra Thin Body Transistors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/sispad.2015.7292338

Publication URI: http://dx.doi.org/10.1109/sispad.2015.7292338

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4673-7858-1