Multi-subband interface roughness scattering using 2D finite element schodinger equation for monte carlo simulations of multi-gate transistors (2015)

First Author: Nagy D
Attributed to:  Modelling of Carrier Transport in Ultra Thin Body Transistors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iwce.2015.7301977

Publication URI: http://dx.doi.org/10.1109/iwce.2015.7301977

Type: Conference/Paper/Proceeding/Abstract