Variability characterisation of nanoscale Si and InGaAs FinFETs at subthreshold (2014)
Attributed to:
Modelling of Carrier Transport in Ultra Thin Body Transistors
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/vari.2014.6957085
Publication URI: http://dx.doi.org/10.1109/vari.2014.6957085
Type: Conference/Paper/Proceeding/Abstract