Variability characterisation of nanoscale Si and InGaAs FinFETs at subthreshold (2014)

First Author: Indalecio G

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/vari.2014.6957085

Publication URI: http://dx.doi.org/10.1109/vari.2014.6957085

Type: Conference/Paper/Proceeding/Abstract