A Discharge-Based Pulse Technique for Probing the Energy Distribution of Positive Charges in Gate Dielectric (2015)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tsm.2015.2407909
Publication URI: http://dx.doi.org/10.1109/tsm.2015.2407909
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Semiconductor Manufacturing
Issue: 3