A new technique for probing the energy distribution of positive charges in gate dielectric (2014)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/icmts.2014.6841470
Publication URI: http://dx.doi.org/10.1109/icmts.2014.6841470
Type: Conference/Paper/Proceeding/Abstract
ISBN: 978-1-4799-2193-5