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A new technique for probing the energy distribution of positive charges in gate dielectric (2014)

First Author: Ji Z

Attributed to: Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/icmts.2014.6841470

Publication URI: http://dx.doi.org/10.1109/icmts.2014.6841470

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4799-2193-5