Engineering of nanoscale defect patterns in CeO2 nanorods via ex situ and in situ annealing. (2015)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c4nr07308h

PubMed Identifier: 25655364

Publication URI: http://europepmc.org/abstract/MED/25655364

Type: Journal Article/Review

Volume: 7

Parent Publication: Nanoscale

Issue: 12

ISSN: 2040-3364