Improved Electrothermal Ruggedness in SiC MOSFETs Compared With Silicon IGBTs (2014)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2014.2323152

Publication URI: http://dx.doi.org/10.1109/ted.2014.2323152

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 7