Multinomial based memristor modelling methodology for simulations and analysis (2014)

First Author: Li G
Attributed to:  Yield and reliability enhancement techniques for novel memory devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1080/21681724.2014.901421

Publication URI: http://dx.doi.org/10.1080/21681724.2014.901421

Type: Journal Article/Review

Parent Publication: International Journal of Electronics Letters

Issue: 1