Gap-Corrected Thin-Film Permittivity and Permeability Measurement With a Broadband Coaxial Line Technique (2016)

First Author: Wang Y

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tmtt.2016.2519915

Publication URI: http://dx.doi.org/10.1109/tmtt.2016.2519915

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Microwave Theory and Techniques

ISSN: 0018-9480