Fault detection and repair of DSC arrays through memristor sensing (2015)
Attributed to:
Yield and reliability enhancement techniques for novel memory devices
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/dft.2015.7315127
Publication URI: http://dx.doi.org/10.1109/dft.2015.7315127
Type: Conference/Paper/Proceeding/Abstract