Exploring error-tolerant low-power multiple-output read scheme for memristor-based memory arrays (2015)

First Author: Adeyemo A
Attributed to:  Yield and reliability enhancement techniques for novel memory devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/dft.2015.7315129

Publication URI: http://dx.doi.org/10.1109/dft.2015.7315129

Type: Conference/Paper/Proceeding/Abstract