AlN-GeO2 based gate stack for improved reliability of Ge MOSFETs (2015)
Attributed to:
High permittivity dielectrics on Ge for end of Roadmap application
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2015.04.081
Publication URI: http://dx.doi.org/10.1016/j.mee.2015.04.081
Type: Journal Article/Review
Parent Publication: Microelectronic Engineering