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Comparison of oxygen vacancy defects in crystalline and amorphous Ta2O5 (2015)

First Author: Guo Y

Attributed to: Mechanisms and Control of Resistive Switching in Dielectrics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2015.04.065

Publication URI: http://dx.doi.org/10.1016/j.mee.2015.04.065

Type: Journal Article/Review

Parent Publication: Microelectronic Engineering