Role and Optimization of the Active Oxide Layer in TiO 2 -Based RRAM (2015)
Attributed to:
Enabling microfocus & thin film X-ray scattering at the University of Southampton
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/adfm.201503522
Publication URI: http://dx.doi.org/10.1002/adfm.201503522
Type: Journal Article/Review
Parent Publication: Advanced Functional Materials
Issue: 4