Phase-Change Memory Properties of Electrodeposited Ge-Sb-Te Thin Film. (2015)
Attributed to:
Enabling microfocus & thin film X-ray scattering at the University of Southampton
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1186/s11671-015-1136-4
PubMed Identifier: 26525703
Publication URI: http://europepmc.org/abstract/MED/26525703
Type: Journal Article/Review
Volume: 10
Parent Publication: Nanoscale research letters
Issue: 1
ISSN: 1556-276X