Estimating and enhancing the tolerance and yield for tunneling SRAM cells by simulation (2011)

First Author: Zuo D
Attributed to:  Silicon Resonant Tunnelling Diodes and Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/sced.2011.5744194

Publication URI: http://dx.doi.org/10.1109/sced.2011.5744194

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4244-7863-7