Estimating and enhancing the tolerance and yield for tunneling SRAM cells by simulation (2011)
Attributed to:
Silicon Resonant Tunnelling Diodes and Circuits
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/sced.2011.5744194
Publication URI: http://dx.doi.org/10.1109/sced.2011.5744194
Type: Conference/Paper/Proceeding/Abstract
ISBN: 978-1-4244-7863-7