Transient Thermoreflectance for Gate Temperature Assessment in Pulse Operated GaN-Based HEMTs (2016)

First Author: Martin-Horcajo S
Attributed to:  Underpinning Power Electronics 2012: Devices Theme funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2016.2595400

Publication URI: http://dx.doi.org/10.1109/led.2016.2595400

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 9