Complementary Resistive Switch-Based Arithmetic Logic Implementations Using Material Implication (2016)

First Author: Yang Y
Attributed to:  Yield and reliability enhancement techniques for novel memory devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tnano.2015.2504841

Publication URI: http://dx.doi.org/10.1109/tnano.2015.2504841

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nanotechnology

Issue: 1