An Approach to Simultaneously Test Multiple Devices for High-Throughput Production of Thin-Film Electronics (2016)

First Author: Kumar A
Attributed to:  AUTOFLEX - Automated Integration of Flexible Electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jdt.2015.2462291

Publication URI: http://dx.doi.org/10.1109/jdt.2015.2462291

Type: Journal Article/Review

Parent Publication: Journal of Display Technology

Issue: 3