Effect of metal oxide additions to quality on Ge/GeO2 interfaces (2016)
Attributed to:
Mechanisms and Control of Resistive Switching in Dielectrics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4963751
Publication URI: http://dx.doi.org/10.1063/1.4963751
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 13