Film thickness measurement and contamination layer correction for quantitative XPS (2016)

First Author: Walton J

Attributed to: Next Generation Biomaterials Discovery funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.5934

Publication URI: http://dx.doi.org/10.1002/sia.5934

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 3

ISSN: 10969918