A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias (2015)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/vlsit.2015.7223693
Publication URI: http://dx.doi.org/10.1109/vlsit.2015.7223693
Type: Conference/Paper/Proceeding/Abstract