A single device based voltage step stress (VSS) technique for fast reliability screening (2014)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/irps.2014.6861145
Publication URI: http://dx.doi.org/10.1109/irps.2014.6861145
Type: Conference/Paper/Proceeding/Abstract