Energy distribution of positive charges in high-k dielectric (2014)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2014.07.030
Publication URI: http://dx.doi.org/10.1016/j.microrel.2014.07.030
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability
Issue: 9-10