Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations (2014)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2014.07.087
Publication URI: http://dx.doi.org/10.1016/j.microrel.2014.07.087
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability
Issue: 9-10