A Comparative Study of Defect Energy Distribution and Its Impact on Degradation Kinetics in GeO 2 /Ge and SiON/Si pMOSFETs (2016)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2016.2597540
Publication URI: http://dx.doi.org/10.1109/ted.2016.2597540
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 10