A new Ultra-Fast Single Pulse technique (UFSP) for channel effective mobility evaluation in MOSFETs (2013)

First Author: Ji Z
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/icmts.2013.6528147

Publication URI: http://dx.doi.org/10.1109/icmts.2013.6528147

Type: Conference/Paper/Proceeding/Abstract