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Towards 3D-Electrical Capacitance Tomography for Interface Detection Thresholding method improves accuracy for real-world 3D process monitoring (2016)

First Author: Clark P
Attributed to:  Embedding Manufacturing Development into Formulation Research (EMFormR) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1595/205651316x691537

Publication URI: http://dx.doi.org/10.1595/205651316x691537

Type: Journal Article/Review

Parent Publication: Johnson Matthey Technology Review

Issue: 2