On the origin of resistive switching volatility in Ni/TiO2/Ni stacks (2016)

First Author: Cortese S

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4960690

Publication URI: http://dx.doi.org/10.1063/1.4960690

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 6