A Memristor SPICE Model Accounting for Volatile Characteristics of Practical ReRAM (2014)

First Author: Berdan R

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2013.2291158

Publication URI: http://dx.doi.org/10.1109/led.2013.2291158

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 1