Higher level spatial analysis of dead pixels on detectors based on local grid geometry (2017)
Attributed to:
Inside-out: Statistical methods for Computed Tomography validation of complex structures in Additive Layer Manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: http://www2.warwick.ac.uk/fac/sci/statistics/crism/research/17-02
Type: Working Paper
Volume: 17
Issue: 02