Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers. (2017)
Attributed to:
Renaissance Germanium
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12654
PubMed Identifier: 28972660
Publication URI: http://europepmc.org/abstract/MED/28972660
Type: Journal Article/Review
Volume: 268
Parent Publication: Journal of microscopy
Issue: 3
ISSN: 0022-2720